Neutrosophic EWMA and DEWMA control chart on Exponential and

Transformed Exponential Distributions

Ishah Maria Mathew1 , O. S. Deepa1,∗

1Department of Mathematics,Amrita School of Physical Sciences,Coimbatore, Amrita Vishwa

Vidyapeetham, India

Emails: m ishahmaria@cb.students.amrita.edu; os deepa@cb.amrita.edu

Abstract

The sophisticated statistical methods known as Bayesian EWMA and DEWMA control charts are intended

to track process performance and identify changes in data over time. They improve the capacity to monitor

minute changes in the process by combining conventional smoothing methods with Bayesian inference. By

integrating the idea of neutrosophic approaches into Bayesian EWMA and DEWMA models, the suggested

approach seeks to address and get beyond this restriction. In this study, neutrosophic approaches are utilized to

provide the manufacturing process with two tolerance limits instead of a set value for upper and lower control

limits, particularly when all observations are uncertain, imprecise, or fuzzy. By combining the Exponential,

Inverse Rayleigh, and Weibull distributions, five symmetric loss functions are examined while taking uniform

prior into account. Additionally, for mean, variance, and control limits of the proposed work have been derived.

Simulation studies were conducted and compared with previous work as well as all projected works. This study

significantly advances the subject of control chart technique, especially when it comes to managing hard, vast,

and complicated information.

Keywords: EWMA; DEWMA; Bayesian approach; Loss function; Monte Carlo Simulation; Average Run

Length