International Journal of Neutrosophic Science IJNS 2690-6805 2692-6148 10.54216/IJNS https://www.americaspg.com/journals/show/3910 2020 2020 Department of Mathematics,Amrita School of Physical Sciences,Coimbatore, Amrita Vishwa Vidyapeetham, India O. O. Department of Mathematics,Amrita School of Physical Sciences,Coimbatore, Amrita Vishwa Vidyapeetham, India O. S. Deepa The sophisticated statistical methods known as Bayesian EWMA and DEWMA control charts are intended to track process performance and identify changes in data over time. They improve the capacity to monitor minute changes in the process by combining conventional smoothing methods with Bayesian inference. By integrating the idea of neutrosophic approaches into Bayesian EWMA and DEWMA models, the suggested approach seeks to address and get beyond this restriction. In this study, neutrosophic approaches are utilized to provide the manufacturing process with two tolerance limits instead of a set value for upper and lower control limits, particularly when all observations are uncertain, imprecise, or fuzzy. By combining the Exponential, Inverse Rayleigh, and Weibull distributions, five symmetric loss functions are examined while taking uniform prior into account. Additionally, for mean, variance, and control limits of the proposed work have been derived. Simulation studies were conducted and compared with previous work as well as all projected works. This study significantly advances the subject of control chart technique, especially when it comes to managing hard, vast, and complicated information. 2025 2025 184 203 10.54216/IJNS.260418 https://www.americaspg.com/articleinfo/21/show/3910