Volume 9 , Issue 2 , PP: 41-55, 2025 | Cite this article as | XML | Html | PDF | Full Length Article
R. Shanmuga Sundaram 1 * , R. Mohanraj 2 * , S. Sasidevi 3
Doi: https://doi.org/10.54216/IJWAC.090205
Time-to-digital converters (TDCs) are vital components in digital circuitry, crucial for synchronization and precise measurement, demanding high resolution and accuracy. This brief introduces a novel TDC designed in order to reduce the impact of fluctuations in process, voltage, and temperature. A process voltage temperature detector using an extra delay line that is optimized for locking situations is incorporated into the suggested TDC to distinguish PVT corners effectively. Implemented in a 90-nm process, on-silicon measurements reveal impressive performance achieving 30-ps resolution.
D-flip-flip (DFF) , Process voltage and temperature (PVT) , PVT corner detector , Time-to-digital converter (TDC)
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